RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?

Authors

  • Vladimir Gurevich

Keywords:

residual current device, RCD, nuisance tripping, harmonic, differential current, leakage current

Abstract

The reasons for nuisance tripping of residual current devices (RCD) are analyzed in the article and the affect of many external factors is discussed. Solutions are described for avoiding faulty tripping of an RCD.

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How to Cite

RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?. (2013). Global Journals of Research in Engineering, 13(F11), 31-40. https://testing.engineeringresearch.org/index.php/GJRE/article/view/100364

 
RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?

Published

2013-07-15

Issue

Vol. 13 No. F11 (2013): GJRE-F Electrical and Electronic: Volume 13 Issue F11

Section

Articles

License

Copyright (c) 2013 Authors and Global Journals Private Limited

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

RCD Nuisance Tripping: Whoas Guilty and what Needs to be Done?. (2013). Global Journals of Research in Engineering, 13(F11), 31-40. https://testing.engineeringresearch.org/index.php/GJRE/article/view/100364