Bench Marking Models of Low Power VLSI Testing Strategies: Current State of the Art. Global Journals of Research in Engineering, [S. l.], v. 13, n. F7, p. 13–31, 2013. Disponível em: https://testing.engineeringresearch.org/index.php/GJRE/article/view/791. Acesso em: 6 jun. 2026.